Atom Probe

The application of field ion microscope atom probe for Materials Science

场离子显微镜原子探针在材料科学中的应用

This article introduces recent developments of three dimensional atom probe techniques .

本文介绍世界上新型三维原子探针技术研究的最新发展。

Development of the atom probe and its application to interface studies of metallic materials

原子探针的发展及其对金属内界面的研究

A Software for Data Processing of Atom Probe

原子探针的数据处理软件

The Calibration of the Atom Probe System

场离子显微镜原子探针系统校正

Investigation of the precipitation process in micro-alloyed steel with three-dimensional atom probe

微合金钢中析出相形核过程的三维原子探针研究

Recent Developments of Three-dimensional Atom Probe Techniques

三维原子探针研制新进展

Three Dimensional Atom Probe & An Instrument for Microstructure Investigation of Materials with Analyzing Atoms One by One

三维原子探针&从探测逐个原子来研究材料的分析仪器

Three Dimensional Atom Probe ;

三维原子探针；

In addition , The new application of the position-sensitive atom probe in steel and alloys research are also introduced with example .

此外还示例概述了位置灵敏原子探针在钢与合金研究中的新应用。最后，作者对世界上三维原子探针的发展前景作了展望。

Precipitation of niobium carbonitride in Nb-microalloyed steel by 3-dimensional atom probe

三维原子探针对铌微合金化钢碳氮化物的析出研究

Investigation on the precipitates in tempering V-Nb micro-alloyed steel by three dimensional atom probe

三维原子探针对回火铌钒微合金钢中析出物的研究

In this paper , the latest development , application and prospect of micro-analytic experiment method with position-sensitive atom probe are described .

本文介绍位置灵敏原子探针显微分析实验手段的最新发展、应用与前景。

Field Ion Microscope and Time-of-Flight Atom Probe and Their Applications to Quantitative Atom Microexamination on Solid Surface ( I )

场离子显微镜和飞行时间原子探针及其在定量研究固体表面原子微观过程中的应用（一）

The acquisition of field emission negative ion and its time-of-flight Spectra ( TOPS ) brings up to negative ion atom probe invention .

场致发射负离子及其飞行时间谱的获得导致场致发射负离子原子探针的发明。

The principle and the progress in the applications of the field ion microscopy and atom probe microanalysis technique in studying crystal defects have been reviewed .

本文概述了场离子显微术（FIM）及原子探针微区分析方法（AP）的基本原理及其在晶体缺陷研究方面应用的新进展。

Traditional atom probe applys a positive electric field on metal sample surface to produce positive ions by field evaporation method , and analyses these ions through measuring its flight time .

传统的原子探针是在针状金属样品表面加上了一个正电场，通过场蒸发把表面粒子变成正离子，再通过其飞行时间质谱来加以检测。

The microstructure of melt spun Cu 88 Co 12 alloy was studied utilizing transmisson electron microscope ( TEM ) and field ion microscope with atom probe ( FIM AP ) .

本文利用场离子显微镜－原子探针（FIM－AP）及电镜研究了具有巨磁电阻效应（GMR）的甩带Cu88Co12合金的微结构。

In this paper , the development of Linear-type Time-of-Flight Atom Probe has been described . The resolution M / △ M is about 300 , and the detect efficiency is about 50 % .

本文叙述直线型原子探针的设计和制造技术，其质量分辨本领M/△M≈300，探测效率约50%。